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NDT: X-ray inspection machines
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Inspection device X-ray - max. 6 000 g, max. 300 p/min | X series
The XC CC CombiChecker is an accurate, secure and reliable product
inspection system that uses a combination of dynamic weighing and
metal detection. This METTLER TOLEDO...
inspection system that uses a combination of dynamic weighing and
metal detection. This METTLER TOLEDO...
Inspection device X-ray - max. 6 000 g, max. 300 p/min | X series
The XC CC CombiChecker is an accurate, secure and reliable product
inspection system that uses a combination of dynamic weighing and
metal detection. This METTLER TOLEDO precision device enables
the production of high quality, consistent as well as safe products.
It can satisfy even the most rigorous quality standards established by
the international food safety regulations and provides a an excellent cost
to performance ratio. The economical design of the XC CC can allow smaller
and less advanced companies to compete with large multi-national corporations
on the global market as it provides top-class quality assurance in addition
to effective brand protection.
inspection system that uses a combination of dynamic weighing and
metal detection. This METTLER TOLEDO precision device enables
the production of high quality, consistent as well as safe products.
It can satisfy even the most rigorous quality standards established by
the international food safety regulations and provides a an excellent cost
to performance ratio. The economical design of the XC CC can allow smaller
and less advanced companies to compete with large multi-national corporations
on the global market as it provides top-class quality assurance in addition
to effective brand protection.
X-ray inspection machine for bulk products
X-ray inspection systems can inspect loose products before being packaged or added as an ingredient to a finished product.
Typical applications include grains, peanuts, extruded snacks, dried fruits, tea/coffee, powders, vegetables...
Typical applications include grains, peanuts, extruded snacks, dried fruits, tea/coffee, powders, vegetables...
X-ray inspection machine for bulk products
X-ray inspection systems can inspect loose products before being packaged or added as an ingredient to a finished product.
Typical applications include grains, peanuts, extruded snacks, dried fruits, tea/coffee, powders, vegetables and pulses.
Location of the X-ray System in the Production Line Consideration should be given to the location of x-ray inspection systems for bulk products in the production line. When placed early in the process, x-ray systems can inspect the incoming goods or raw materials. Contaminants can be removed at source and immediately traced back to the supplier.
Contaminants within incoming goods will be at their largest and most easily detectable; further downstream, they may get broken into smaller, less detectable fragments as part of the manufacturing process. Removing contaminants at an early stage also protects processing equipment from possible expensive damage.
Typical applications include grains, peanuts, extruded snacks, dried fruits, tea/coffee, powders, vegetables and pulses.
Location of the X-ray System in the Production Line Consideration should be given to the location of x-ray inspection systems for bulk products in the production line. When placed early in the process, x-ray systems can inspect the incoming goods or raw materials. Contaminants can be removed at source and immediately traced back to the supplier.
Contaminants within incoming goods will be at their largest and most easily detectable; further downstream, they may get broken into smaller, less detectable fragments as part of the manufacturing process. Removing contaminants at an early stage also protects processing equipment from possible expensive damage.
Flaw detector / X-ray - 40 ± 5°
The AXFQ series is a x-ray flaw detector developed by Angstrom Advanced. It is...
Flaw detector / X-ray - 40 ± 5°
The AXFQ series is a x-ray flaw detector developed by Angstrom Advanced. It is...
Flaw detector / X-ray - 30 ± 5°
AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube) is designed to enhance the functioning...
Flaw detector / X-ray - 30 ± 5°
AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube) is designed to enhance the functioning of the Non Destructive Testing (NDT)c of welding seam of pipes and tubes that are of small diameters. It comes with optional propelling wheels or installed pipe crawler. The X-ray generator can be places easily in the pipe. The NDT of circumferential wedding can be completed within a single exposure.
X-ray detector for industrial inspection machine - 20 - 160 KeV | X-Scan f3 series
The X-Scan f3 series is a X-ray detector for industrial inspection machine, manufactured by Detection Technology. This product is suitable for food, pharmaceutical and...
X-ray detector for industrial inspection machine - 20 - 160 KeV | X-Scan f3 series
The X-Scan f3 series is a X-ray detector for industrial inspection machine, manufactured by Detection Technology. This product is suitable for food, pharmaceutical and industrial NDT inspection necessities. It is operated with quick speed, high sensitivity and high resolution including an identified object transmitted on a belt conveyor or the same apparatus.
This offers an active length ranging from 102mm to 1634mm, optional pixel sizes such as 0.2mm, 0.4mm, 0.8mm and 1.5mm and 20 KeV - 160 KeV. It has maximum 3.3 m/s conveyor speed, dynamic range greater than 2000 and 14 bit AD. This has support USB 2.0 and frame grabber card interfaces.
This offers an active length ranging from 102mm to 1634mm, optional pixel sizes such as 0.2mm, 0.4mm, 0.8mm and 1.5mm and 20 KeV - 160 KeV. It has maximum 3.3 m/s conveyor speed, dynamic range greater than 2000 and 14 bit AD. This has support USB 2.0 and frame grabber card interfaces.
X-ray detector for industrial inspection machine - 20 - 160 KeV | X-Scan c4 series
The X-Scan c4 series is manufactured by Detection Technology, and is an X-ray detector that is highly utilized for industrial inspection machine. It is constructed...
X-ray detector for industrial inspection machine - 20 - 160 KeV | X-Scan c4 series
The X-Scan c4 series is manufactured by Detection Technology, and is an X-ray detector that is highly utilized for industrial inspection machine. It is constructed to simplify the structure of industrial X-ray machines and to cut down the overall system cost.
The unit has active length from 102 mm to 614 mm, which has pixel size options of 0.2 mm, 0.4 mm, 0.8 mm and 1.5 mm. It also has conveyor speed up to 3.3 m/s with up to 14-bit AD, with dynamic range of > 2000.
There is a firmware upgrade by means of a USB 2.0 interface that has a command set compatible with F3 series products.
The unit has active length from 102 mm to 614 mm, which has pixel size options of 0.2 mm, 0.4 mm, 0.8 mm and 1.5 mm. It also has conveyor speed up to 3.3 m/s with up to 14-bit AD, with dynamic range of > 2000.
There is a firmware upgrade by means of a USB 2.0 interface that has a command set compatible with F3 series products.
X-ray NDT inspection module - 0.160 - 5 MeV | X-Scan iHE
The X-Scan iHE is a detector subsystem engineered by DT. It is suitable for use in high-energy industrial NDT applications that ensure high sensitivity and speed.
The...
The...
X-ray NDT inspection module - 0.160 - 5 MeV | X-Scan iHE
The X-Scan iHE is a detector subsystem engineered by DT. It is suitable for use in high-energy industrial NDT applications that ensure high sensitivity and speed.
The unit offers an efficient solution for a wide range of X-ray source through the energy range of 160KV to 5 MeV. It is available with an active length from 410 mm to 1638 mm. The subsystem can have a pixel size of 0.2 mm, 0.4 mm, or 0.8 mm. It features a minimum integration time of 0.8 ms.
The X-Scan iHE is equipped with a 16-bit AD, offering a dynamic range more than 8000. It can be used with ethernet and frame grabber card interfaces. In addition, it also supports continuous and non-continuous sources.
The unit offers an efficient solution for a wide range of X-ray source through the energy range of 160KV to 5 MeV. It is available with an active length from 410 mm to 1638 mm. The subsystem can have a pixel size of 0.2 mm, 0.4 mm, or 0.8 mm. It features a minimum integration time of 0.8 ms.
The X-Scan iHE is equipped with a 16-bit AD, offering a dynamic range more than 8000. It can be used with ethernet and frame grabber card interfaces. In addition, it also supports continuous and non-continuous sources.